@inproceedings{182eb879782a4f9eaf6454e23315765c,
title = "Determining strain, chemical composition, and thermal properties of Si/SiGe nanostructures via Raman scattering spectroscopy",
abstract = "Studies by Raman spectroscopy of two kinds of Si/SiGe nanostructures-quantum dot multilayers and planar superlattices-reveal a wide variety of spectral features including first- and second-order Raman scattering, polarized Raman scattering, and low-frequency inelastic light scattering associated with folded acoustic phonons. Here we overview how such features can be employed to semi-quantitatively analyze the strain, chemical composition, and thermal conductivity in these industrially important materials that are widely used for producing electronic and optoelectronic devices.",
author = "L. Tsybeskov and Mala, {S. A.} and X. Wang and Baribeau, {J. M.} and X. Wu and Lockwood, {D. J.}",
note = "Publisher Copyright: {\textcopyright} The Electrochemical Society.; Symposium on Pits and Pores 8: Nanomaterials - Fabrication, Properties, and Applications - AiMES 2018, ECS and SMEQ Joint International Meeting ; Conference date: 30-09-2018 Through 04-10-2018",
year = "2018",
doi = "10.1149/08601.0099ecst",
language = "English (US)",
isbn = "9781510871618",
series = "ECS Transactions",
publisher = "Electrochemical Society Inc.",
number = "1",
pages = "99--113",
editor = "P. Granitzer and R. Boukherroub and D.J. Lockwood and H. Masuda and S. Virtanen",
booktitle = "ECS Transactions",
edition = "1",
}