Determining strain, chemical composition, and thermal properties of Si/SiGe nanostructures via Raman scattering spectroscopy
- L. Tsybeskov
- , S. A. Mala
- , X. Wang
- , J. M. Baribeau
- , X. Wu
- , D. J. Lockwood
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
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