Determining strain, chemical composition, and thermal properties of Si/SiGe nanostructures via Raman scattering spectroscopy

L. Tsybeskov, S. A. Mala, X. Wang, J. M. Baribeau, X. Wu, D. J. Lockwood

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

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Engineering & Materials Science