Determining thickness independently from optical constants using ultrafast spectral interferometry

Feng Huang, John Federici, Dale Gary, Thomas Jedju, Warren S. Warren

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We show that the application of ultrafast techniques, specially femtosecond lasers, allow simultaneous measurements of material thickness and optical constants from transmission measurements using a frequency interferometer.

Original languageEnglish (US)
Title of host publication2005 Conference on Lasers and Electro-Optics, CLEO
Pages1103-1105
Number of pages3
StatePublished - Dec 1 2005
Event2005 Conference on Lasers and Electro-Optics, CLEO - Baltimore, MD, United States
Duration: May 22 2005May 27 2005

Publication series

Name2005 Conference on Lasers and Electro-Optics, CLEO
Volume2

Other

Other2005 Conference on Lasers and Electro-Optics, CLEO
CountryUnited States
CityBaltimore, MD
Period5/22/055/27/05

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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