Determining thickness independently from optical constants using ultrafast spectral interferometry

Feng Huang; John Federici; Dale Gary; Thomas Jedju; Warren S. Warren

Determining thickness independently from optical constants using ultrafast spectral interferometry

Feng Huang, John Federici, Dale Gary, Thomas Jedju, Warren S. Warren

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We show that the application of ultrafast techniques, specially femtosecond lasers, allow simultaneous measurements of material thickness and optical constants from transmission measurements using a frequency interferometer.

Original language	English (US)
Title of host publication	Conference on Lasers and Electro-Optics, CLEO 2005
Publisher	Optical Society of America
ISBN (Print)	1557527709, 9781557527707
State	Published - 2005
Event	Conference on Lasers and Electro-Optics, CLEO 2005 - Baltimore, MD, United States Duration: May 22 2005 → May 22 2005

Publication series

Name	Optics InfoBase Conference Papers
ISSN (Electronic)	2162-2701

Other

Other	Conference on Lasers and Electro-Optics, CLEO 2005
Country/Territory	United States
City	Baltimore, MD
Period	5/22/05 → 5/22/05

All Science Journal Classification (ASJC) codes

Instrumentation
Atomic and Molecular Physics, and Optics

Cite this

@inproceedings{c1c326cc91c640cfa08478385e5751ea,

title = "Determining thickness independently from optical constants using ultrafast spectral interferometry",

abstract = "We show that the application of ultrafast techniques, specially femtosecond lasers, allow simultaneous measurements of material thickness and optical constants from transmission measurements using a frequency interferometer.",

author = "Feng Huang and John Federici and Dale Gary and Thomas Jedju and Warren, {Warren S.}",

year = "2005",

language = "English (US)",

isbn = "1557527709",

series = "Optics InfoBase Conference Papers",

publisher = "Optical Society of America",

booktitle = "Conference on Lasers and Electro-Optics, CLEO 2005",

note = "Conference on Lasers and Electro-Optics, CLEO 2005 ; Conference date: 22-05-2005 Through 22-05-2005",

}

TY - GEN

T1 - Determining thickness independently from optical constants using ultrafast spectral interferometry

AU - Huang, Feng

AU - Federici, John

AU - Gary, Dale

AU - Jedju, Thomas

AU - Warren, Warren S.

PY - 2005

Y1 - 2005

N2 - We show that the application of ultrafast techniques, specially femtosecond lasers, allow simultaneous measurements of material thickness and optical constants from transmission measurements using a frequency interferometer.

AB - We show that the application of ultrafast techniques, specially femtosecond lasers, allow simultaneous measurements of material thickness and optical constants from transmission measurements using a frequency interferometer.

UR - http://www.scopus.com/inward/record.url?scp=84899134531&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84899134531&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:84899134531

SN - 1557527709

SN - 9781557527707

T3 - Optics InfoBase Conference Papers

BT - Conference on Lasers and Electro-Optics, CLEO 2005

PB - Optical Society of America

T2 - Conference on Lasers and Electro-Optics, CLEO 2005

Y2 - 22 May 2005 through 22 May 2005

ER -

Determining thickness independently from optical constants using ultrafast spectral interferometry

Abstract

Publication series

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All Science Journal Classification (ASJC) codes

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