Developments in delay testing

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

The author's objective is to introduce the reader to the fast emerging field of AC test for digital logic circuits. He includes a brief discussion of the important concepts, algorithms and circuits that are used in conjunction with AC test. A comprehensive bibliography is provided.

Original languageEnglish (US)
Title of host publicationDigest of Papers - 1992 IEEE VLSI Test Symposium, VLSI 1992
PublisherIEEE Computer Society
Pages247-253
Number of pages7
ISBN (Electronic)0780306236
DOIs
StatePublished - Jan 1 1992
Externally publishedYes
Event1992 IEEE VLSI Test Symposium, VLSI 1992 - Atlantic City, United States
Duration: Apr 7 1992Apr 9 1992

Publication series

NameProceedings of the IEEE VLSI Test Symposium
Volume1992-April

Conference

Conference1992 IEEE VLSI Test Symposium, VLSI 1992
Country/TerritoryUnited States
CityAtlantic City
Period4/7/924/9/92

All Science Journal Classification (ASJC) codes

  • Computer Science Applications
  • Electrical and Electronic Engineering

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