Developments in delay testing

J. Savir

doi:10.1109/VTEST.1992.232760

Developments in delay testing

J. Savir

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Scopus citations

Abstract

The author's objective is to introduce the reader to the fast emerging field of AC test for digital logic circuits. He includes a brief discussion of the important concepts, algorithms and circuits that are used in conjunction with AC test. A comprehensive bibliography is provided.

Original language	English (US)
Title of host publication	Digest of Papers - 1992 IEEE VLSI Test Symposium, VLSI 1992
Publisher	IEEE Computer Society
Pages	247-253
Number of pages	7
ISBN (Electronic)	0780306236
DOIs	https://doi.org/10.1109/VTEST.1992.232760
State	Published - 1992
Externally published	Yes
Event	1992 IEEE VLSI Test Symposium, VLSI 1992 - Atlantic City, United States Duration: Apr 7 1992 → Apr 9 1992

Publication series

Name	Proceedings of the IEEE VLSI Test Symposium
Volume	1992-April

Conference

Conference	1992 IEEE VLSI Test Symposium, VLSI 1992
Country/Territory	United States
City	Atlantic City
Period	4/7/92 → 4/9/92

All Science Journal Classification (ASJC) codes

Computer Science Applications
Electrical and Electronic Engineering

Access to Document

10.1109/VTEST.1992.232760

Cite this

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title = "Developments in delay testing",

abstract = "The author's objective is to introduce the reader to the fast emerging field of AC test for digital logic circuits. He includes a brief discussion of the important concepts, algorithms and circuits that are used in conjunction with AC test. A comprehensive bibliography is provided.",

author = "J. Savir",

note = "Publisher Copyright: {\textcopyright} 1992 IEEE.; 1992 IEEE VLSI Test Symposium, VLSI 1992 ; Conference date: 07-04-1992 Through 09-04-1992",

year = "1992",

doi = "10.1109/VTEST.1992.232760",

language = "English (US)",

series = "Proceedings of the IEEE VLSI Test Symposium",

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AB - The author's objective is to introduce the reader to the fast emerging field of AC test for digital logic circuits. He includes a brief discussion of the important concepts, algorithms and circuits that are used in conjunction with AC test. A comprehensive bibliography is provided.

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M3 - Conference contribution

AN - SCOPUS:84958732523

T3 - Proceedings of the IEEE VLSI Test Symposium

SP - 247

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BT - Digest of Papers - 1992 IEEE VLSI Test Symposium, VLSI 1992

PB - IEEE Computer Society

T2 - 1992 IEEE VLSI Test Symposium, VLSI 1992

Y2 - 7 April 1992 through 9 April 1992

ER -

Developments in delay testing

Abstract

Publication series

Conference

All Science Journal Classification (ASJC) codes

Access to Document

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Cite this