DISTINGUISHING BETWEEN TWO STUCK FAULTS.

J. P. Roth, J. Savir

Research output: Contribution to journalArticlepeer-review

Abstract

The paper describes a test to distinguish between two non-equivalent stuck faults during electronic circuit testing. An algorithm is described which can easily be incorporated into existing test packages. The algorithm is based on the D-ALG, which has been previously used in test generation programs.

Original languageEnglish (US)
Pages (from-to)4206-4208
Number of pages3
JournalIBM technical disclosure bulletin
Volume25
Issue number8
StatePublished - Jan 1 1983
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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