Abstract
The paper describes a test to distinguish between two non-equivalent stuck faults during electronic circuit testing. An algorithm is described which can easily be incorporated into existing test packages. The algorithm is based on the D-ALG, which has been previously used in test generation programs.
Original language | English (US) |
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Pages (from-to) | 4206-4208 |
Number of pages | 3 |
Journal | IBM technical disclosure bulletin |
Volume | 25 |
Issue number | 8 |
State | Published - 1983 |
Externally published | Yes |
All Science Journal Classification (ASJC) codes
- General Engineering