Abstract
The paper describes a test to distinguish between two non-equivalent stuck faults during electronic circuit testing. An algorithm is described which can easily be incorporated into existing test packages. The algorithm is based on the D-ALG, which has been previously used in test generation programs.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 4206-4208 |
| Number of pages | 3 |
| Journal | IBM technical disclosure bulletin |
| Volume | 25 |
| Issue number | 8 |
| State | Published - 1983 |
| Externally published | Yes |
All Science Journal Classification (ASJC) codes
- General Engineering