The paper describes a test to distinguish between two non-equivalent stuck faults during electronic circuit testing. An algorithm is described which can easily be incorporated into existing test packages. The algorithm is based on the D-ALG, which has been previously used in test generation programs.
|Original language||English (US)|
|Number of pages||3|
|Journal||IBM technical disclosure bulletin|
|State||Published - Jan 1 1983|
All Science Journal Classification (ASJC) codes