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DISTINGUISHING BETWEEN TWO STUCK FAULTS.
J. P. Roth,
J. Savir
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Keyphrases
Circuit Testing
50%
Electronic Circuit
50%
Generation Program
50%
Stuck-at Faults
100%
Test Case Generation
50%
Computer Science
Test Generation Program
100%
Material Science
Electronic Circuit
100%
Engineering
Networks (Circuits)
100%