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Dynamic resistance - A metric for variability characterization of phase-change memory
Bipin Rajendran, Matt Breitwisch, Ming Hsiu Lee, Geoffrey W. Burr, Yen Hao Shih, Roger Cheek, Alejandro Schrott, Chieh Fang Chen, Eric Joseph, Ravi Dasaka, H. L. Lung, Chung Lam
Research output: Contribution to journal › Article › peer-review
23
Scopus
citations