Dynamic resistance - A metric for variability characterization of phase-change memory

Bipin Rajendran, Matt Breitwisch, Ming Hsiu Lee, Geoffrey W. Burr, Yen Hao Shih, Roger Cheek, Alejandro Schrott, Chieh Fang Chen, Eric Joseph, Ravi Dasaka, H. L. Lung, Chung Lam

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Engineering & Materials Science