Edge effect on thermally excited mag-noise in magnetic tunnel junction sensors

T. Zeng, Y. Zhou, K. W. Lin, P. T. Lai, P. W.T. Pong

Research output: Contribution to journalArticlepeer-review

3 Scopus citations


Thermally excited magnetic noise (mag-noise) has gradually become a major concern in magnetic tunnel junction sensors. By conducting micromagnetic simulation, the spatial distribution of thermal mag-noise in the free layer (FL) was obtained under various hard bias (HB) field and applied field. It was demonstrated that the edges are the main contributor of thermal mag-noise in the FL. This result could be explained by the nonuniform distribution of the stiffness field around the edges. It was also found that both HB field and applied field could suppress the thermal mag-noise in edges. A relatively high applied field will decrease the influence of HB field on mag-noise in the edges.

Original languageEnglish (US)
Article number6332899
Pages (from-to)2831-2834
Number of pages4
JournalIEEE Transactions on Magnetics
Issue number11
StatePublished - 2012
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering


  • Applied field
  • Edges
  • Free layer (FL)
  • Hard bias field
  • Magnetic tunnel junction (MTJ)
  • Spatial distribution
  • Thermal mag-noise


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