Effect of field cooling process and ion-beam bombardment on the exchange bias of NiCo/(Ni, Co)O bilayers

X. Li; K. W. Lin; H. Y. Liu; D. H. Wei; G. J. Li; P. W.T. Pong

doi:10.1016/j.tsf.2014.03.032

Effect of field cooling process and ion-beam bombardment on the exchange bias of NiCo/(Ni, Co)O bilayers

X. Li, K. W. Lin, H. Y. Liu, D. H. Wei, G. J. Li, P. W.T. Pong

Research output: Contribution to journal › Article › peer-review

11 Scopus citations

Abstract

The research on exchange coupled ferromagnetic/antiferromagnetic (FM/AF) bilayers has been the foundation of spintronic applications such as hard disk reading heads and spin torque oscillators. In order to further explore the exchange bias behavior of NiCo/(Ni, Co)O bilayers, effect of field cooling process, magnetic angular dependence, and ion-beam bombardment was investigated. The difference in film composition resulted in remarkable distinction in crystalline structures and domain patterns. The exchange bias field (H_ex) in the bilayer systems exhibited a strong angular dependence. The negative H_ex after a field cooling process indicated that the polarity of H_ex can be defined by aligning the magnetization orientation of the FM NiCo layer with the applied field. Moreover, enhanced exchange bias effect was observed in the NiCo/(Ni, Co)O bilayers that resulted from the surface of the (Ni, Co)O layers bombarded with different Ar⁺ ion-beam energies using End-Hall voltages from 0 V to 150 V. The interface spin structures as well as the surface domain patterns were altered by the ion-beam bombardment process. These results indicated that the exchange bias field of NiCo/(Ni, Co)O bilayer systems could be tailored by field cooling process, angular dependence of magnetic properties, and post ion-beam bombardment.

Original language	English (US)
Pages (from-to)	383-389
Number of pages	7
Journal	Thin Solid Films
Volume	570
Issue number	PB
DOIs	https://doi.org/10.1016/j.tsf.2014.03.032
State	Published - Nov 3 2014
Externally published	Yes

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Surfaces and Interfaces
Surfaces, Coatings and Films
Metals and Alloys
Materials Chemistry

Keywords

Exchange bias
Ion-beam bombardment
Magnetic thin films

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10.1016/j.tsf.2014.03.032

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@article{d990242a80f24294a201815561e64cd2,

title = "Effect of field cooling process and ion-beam bombardment on the exchange bias of NiCo/(Ni, Co)O bilayers",

abstract = "The research on exchange coupled ferromagnetic/antiferromagnetic (FM/AF) bilayers has been the foundation of spintronic applications such as hard disk reading heads and spin torque oscillators. In order to further explore the exchange bias behavior of NiCo/(Ni, Co)O bilayers, effect of field cooling process, magnetic angular dependence, and ion-beam bombardment was investigated. The difference in film composition resulted in remarkable distinction in crystalline structures and domain patterns. The exchange bias field (Hex) in the bilayer systems exhibited a strong angular dependence. The negative Hex after a field cooling process indicated that the polarity of Hex can be defined by aligning the magnetization orientation of the FM NiCo layer with the applied field. Moreover, enhanced exchange bias effect was observed in the NiCo/(Ni, Co)O bilayers that resulted from the surface of the (Ni, Co)O layers bombarded with different Ar+ ion-beam energies using End-Hall voltages from 0 V to 150 V. The interface spin structures as well as the surface domain patterns were altered by the ion-beam bombardment process. These results indicated that the exchange bias field of NiCo/(Ni, Co)O bilayer systems could be tailored by field cooling process, angular dependence of magnetic properties, and post ion-beam bombardment.",

keywords = "Exchange bias, Ion-beam bombardment, Magnetic thin films",

author = "X. Li and Lin, {K. W.} and Liu, {H. Y.} and Wei, {D. H.} and Li, {G. J.} and Pong, {P. W.T.}",

note = "Publisher Copyright: {\textcopyright} 2014 Elsevier B.V.",

year = "2014",

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doi = "10.1016/j.tsf.2014.03.032",

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T1 - Effect of field cooling process and ion-beam bombardment on the exchange bias of NiCo/(Ni, Co)O bilayers

AU - Li, X.

AU - Lin, K. W.

AU - Liu, H. Y.

AU - Wei, D. H.

AU - Li, G. J.

AU - Pong, P. W.T.

PY - 2014/11/3

Y1 - 2014/11/3

N2 - The research on exchange coupled ferromagnetic/antiferromagnetic (FM/AF) bilayers has been the foundation of spintronic applications such as hard disk reading heads and spin torque oscillators. In order to further explore the exchange bias behavior of NiCo/(Ni, Co)O bilayers, effect of field cooling process, magnetic angular dependence, and ion-beam bombardment was investigated. The difference in film composition resulted in remarkable distinction in crystalline structures and domain patterns. The exchange bias field (Hex) in the bilayer systems exhibited a strong angular dependence. The negative Hex after a field cooling process indicated that the polarity of Hex can be defined by aligning the magnetization orientation of the FM NiCo layer with the applied field. Moreover, enhanced exchange bias effect was observed in the NiCo/(Ni, Co)O bilayers that resulted from the surface of the (Ni, Co)O layers bombarded with different Ar+ ion-beam energies using End-Hall voltages from 0 V to 150 V. The interface spin structures as well as the surface domain patterns were altered by the ion-beam bombardment process. These results indicated that the exchange bias field of NiCo/(Ni, Co)O bilayer systems could be tailored by field cooling process, angular dependence of magnetic properties, and post ion-beam bombardment.

AB - The research on exchange coupled ferromagnetic/antiferromagnetic (FM/AF) bilayers has been the foundation of spintronic applications such as hard disk reading heads and spin torque oscillators. In order to further explore the exchange bias behavior of NiCo/(Ni, Co)O bilayers, effect of field cooling process, magnetic angular dependence, and ion-beam bombardment was investigated. The difference in film composition resulted in remarkable distinction in crystalline structures and domain patterns. The exchange bias field (Hex) in the bilayer systems exhibited a strong angular dependence. The negative Hex after a field cooling process indicated that the polarity of Hex can be defined by aligning the magnetization orientation of the FM NiCo layer with the applied field. Moreover, enhanced exchange bias effect was observed in the NiCo/(Ni, Co)O bilayers that resulted from the surface of the (Ni, Co)O layers bombarded with different Ar+ ion-beam energies using End-Hall voltages from 0 V to 150 V. The interface spin structures as well as the surface domain patterns were altered by the ion-beam bombardment process. These results indicated that the exchange bias field of NiCo/(Ni, Co)O bilayer systems could be tailored by field cooling process, angular dependence of magnetic properties, and post ion-beam bombardment.

KW - Exchange bias

KW - Ion-beam bombardment

KW - Magnetic thin films

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Effect of field cooling process and ion-beam bombardment on the exchange bias of NiCo/(Ni, Co)O bilayers

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