Electric-Field-Induced Soft-Mode Hardening in SrTiO3 Films

I. A. Akimov; A. A. Sirenko; A. M. Clark; J. H. Hao; X. X. Xi

doi:10.1103/PhysRevLett.84.4625

Electric-Field-Induced Soft-Mode Hardening in SrTiO₃ Films

I. A. Akimov, A. A. Sirenko, A. M. Clark, J. H. Hao, X. X. Xi

Research output: Contribution to journal › Article › peer-review

111 Scopus citations

Abstract

We have studied electric-field-induced Raman scattering in SrTiO3 thin films using an indium-tin-oxide/SrTiO₃/SrRuO₃ structure grown by pulsed laser deposition. The soft mode polarized along the field becomes Raman active. Experimental data for electric-field-induced hardening of the soft modes and the tuning of the static dielectric constant are in agreement described by the Lyddane-Sachs-Teller formalism. The markedly different behavior of the soft modes in thin films from that in the bulk is explained by the existence of local polar regions.

Original language	English (US)
Pages (from-to)	4625-4628
Number of pages	4
Journal	Physical Review Letters
Volume	84
Issue number	20
DOIs	https://doi.org/10.1103/PhysRevLett.84.4625
State	Published - 2000
Externally published	Yes

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General Physics and Astronomy

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10.1103/PhysRevLett.84.4625

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title = "Electric-Field-Induced Soft-Mode Hardening in SrTiO3 Films",

abstract = "We have studied electric-field-induced Raman scattering in SrTiO3 thin films using an indium-tin-oxide/SrTiO3/SrRuO3 structure grown by pulsed laser deposition. The soft mode polarized along the field becomes Raman active. Experimental data for electric-field-induced hardening of the soft modes and the tuning of the static dielectric constant are in agreement described by the Lyddane-Sachs-Teller formalism. The markedly different behavior of the soft modes in thin films from that in the bulk is explained by the existence of local polar regions.",

author = "Akimov, \{I. A.\} and Sirenko, \{A. A.\} and Clark, \{A. M.\} and Hao, \{J. H.\} and Xi, \{X. X.\}",

year = "2000",

doi = "10.1103/PhysRevLett.84.4625",

language = "English (US)",

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pages = "4625--4628",

journal = "Physical Review Letters",

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T1 - Electric-Field-Induced Soft-Mode Hardening in SrTiO3 Films

AU - Akimov, I. A.

AU - Sirenko, A. A.

AU - Clark, A. M.

AU - Hao, J. H.

AU - Xi, X. X.

PY - 2000

Y1 - 2000

N2 - We have studied electric-field-induced Raman scattering in SrTiO3 thin films using an indium-tin-oxide/SrTiO3/SrRuO3 structure grown by pulsed laser deposition. The soft mode polarized along the field becomes Raman active. Experimental data for electric-field-induced hardening of the soft modes and the tuning of the static dielectric constant are in agreement described by the Lyddane-Sachs-Teller formalism. The markedly different behavior of the soft modes in thin films from that in the bulk is explained by the existence of local polar regions.

AB - We have studied electric-field-induced Raman scattering in SrTiO3 thin films using an indium-tin-oxide/SrTiO3/SrRuO3 structure grown by pulsed laser deposition. The soft mode polarized along the field becomes Raman active. Experimental data for electric-field-induced hardening of the soft modes and the tuning of the static dielectric constant are in agreement described by the Lyddane-Sachs-Teller formalism. The markedly different behavior of the soft modes in thin films from that in the bulk is explained by the existence of local polar regions.

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UR - https://www.scopus.com/inward/citedby.url?scp=0000263765&partnerID=8YFLogxK

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DO - 10.1103/PhysRevLett.84.4625

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JO - Physical Review Letters

JF - Physical Review Letters

IS - 20

ER -

Electric-Field-Induced Soft-Mode Hardening in SrTiO₃ Films

Abstract

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