Electron accumulation at nonpolar and semipolar surfaces of wurtzite InN from generalized infrared ellipsometry

V. Darakchieva; M. Schubert; T. Hofmann; B. Monemar; Ching Lien Hsiao; Ting Wei Liu; Li Chyong Chen; W. J. Schaff; Y. Takagi; Y. Nanishi

doi:10.1063/1.3261731

Electron accumulation at nonpolar and semipolar surfaces of wurtzite InN from generalized infrared ellipsometry

V. Darakchieva
, M. Schubert
, T. Hofmann
, B. Monemar
, Ching Lien Hsiao
, Ting Wei Liu
, Li Chyong Chen
, W. J. Schaff
, Y. Takagi
, Y. Nanishi

Research output: Contribution to journal › Article › peer-review

26 Scopus citations

Abstract

The free electron properties of nonpolar (11 2̄0) -oriented and semipolar (10 1̄1) -oriented wurtzite InN films are studied by generalized infrared ellipsometry (GIRSE). We demonstrate the sensitivity of GIRSE to the surface charge accumulation layer and find a distinct surface electron accumulation to occur at all surfaces. The obtained surface electron sheet densities are found to vary from 0.9× 10¹³ to 2.3× 10¹⁴ cm^-2 depending on the surface orientation and bulk electron concentration. The upper limits of the surface electron mobility parameters of 417-644 cm² /V s are determined and discussed in the light of electron confinement at the surface.

Original language	English (US)
Article number	202103
Journal	Applied Physics Letters
Volume	95
Issue number	20
DOIs	https://doi.org/10.1063/1.3261731
State	Published - 2009
Externally published	Yes

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

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10.1063/1.3261731

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title = "Electron accumulation at nonpolar and semipolar surfaces of wurtzite InN from generalized infrared ellipsometry",

abstract = "The free electron properties of nonpolar (11 {\=2}0) -oriented and semipolar (10 {\=1}1) -oriented wurtzite InN films are studied by generalized infrared ellipsometry (GIRSE). We demonstrate the sensitivity of GIRSE to the surface charge accumulation layer and find a distinct surface electron accumulation to occur at all surfaces. The obtained surface electron sheet densities are found to vary from 0.9× 1013 to 2.3× 1014 cm-2 depending on the surface orientation and bulk electron concentration. The upper limits of the surface electron mobility parameters of 417-644 cm2 /V s are determined and discussed in the light of electron confinement at the surface.",

author = "V. Darakchieva and M. Schubert and T. Hofmann and B. Monemar and Hsiao, \{Ching Lien\} and Liu, \{Ting Wei\} and Chen, \{Li Chyong\} and Schaff, \{W. J.\} and Y. Takagi and Y. Nanishi",

year = "2009",

doi = "10.1063/1.3261731",

language = "English (US)",

volume = "95",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "20",

}

TY - JOUR

T1 - Electron accumulation at nonpolar and semipolar surfaces of wurtzite InN from generalized infrared ellipsometry

AU - Darakchieva, V.

AU - Schubert, M.

AU - Hofmann, T.

AU - Monemar, B.

AU - Hsiao, Ching Lien

AU - Liu, Ting Wei

AU - Chen, Li Chyong

AU - Schaff, W. J.

AU - Takagi, Y.

AU - Nanishi, Y.

PY - 2009

Y1 - 2009

N2 - The free electron properties of nonpolar (11 2̄0) -oriented and semipolar (10 1̄1) -oriented wurtzite InN films are studied by generalized infrared ellipsometry (GIRSE). We demonstrate the sensitivity of GIRSE to the surface charge accumulation layer and find a distinct surface electron accumulation to occur at all surfaces. The obtained surface electron sheet densities are found to vary from 0.9× 1013 to 2.3× 1014 cm-2 depending on the surface orientation and bulk electron concentration. The upper limits of the surface electron mobility parameters of 417-644 cm2 /V s are determined and discussed in the light of electron confinement at the surface.

AB - The free electron properties of nonpolar (11 2̄0) -oriented and semipolar (10 1̄1) -oriented wurtzite InN films are studied by generalized infrared ellipsometry (GIRSE). We demonstrate the sensitivity of GIRSE to the surface charge accumulation layer and find a distinct surface electron accumulation to occur at all surfaces. The obtained surface electron sheet densities are found to vary from 0.9× 1013 to 2.3× 1014 cm-2 depending on the surface orientation and bulk electron concentration. The upper limits of the surface electron mobility parameters of 417-644 cm2 /V s are determined and discussed in the light of electron confinement at the surface.

UR - https://www.scopus.com/pages/publications/70549101089

UR - https://www.scopus.com/pages/publications/70549101089#tab=citedBy

U2 - 10.1063/1.3261731

DO - 10.1063/1.3261731

M3 - Article

AN - SCOPUS:70549101089

SN - 0003-6951

VL - 95

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 20

M1 - 202103

ER -

Electron accumulation at nonpolar and semipolar surfaces of wurtzite InN from generalized infrared ellipsometry

Abstract

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