TY - JOUR
T1 - Emissivity of electronic materials, coatings, and structures
AU - Muley, Sarang V.
AU - Ravindra, Nuggehalli M.
N1 - Funding Information:
Work on emissivity measurements and modeling, at NJIT, began in the 1990s. The work was sponsored by the Defense Advanced Research Projects Agency (DARPA, under the Microelectronics Manufacturing Science and Technology [MMST] Program with Dr. Arati Prabhakar, now Director, DARPA and the late Mr. Raymond S. Balcerak, Program Manager at DARPA), Department of Defense–University Research Instrumentation Program (DOD-DURIP), and SEMATECH. This work is dedicated to Mr. Balcerak, his leadership, and his vision.
PY - 2014/4
Y1 - 2014/4
N2 - This study presents an overview of commonly used electronic materials and nanocoatings, as well as the evolution and significance of emissivity of commonly used electronic materials and nanocoatings. In addition, some key issues are addressed, such as accurate temperature measurements during materials processing and control as well as thermal management in high-power electronic device applications. Case studies of the optical properties of bulk materials, multilayered structures, and electronic devices, mainly bolometers, are discussed and analyzed for optimization.
AB - This study presents an overview of commonly used electronic materials and nanocoatings, as well as the evolution and significance of emissivity of commonly used electronic materials and nanocoatings. In addition, some key issues are addressed, such as accurate temperature measurements during materials processing and control as well as thermal management in high-power electronic device applications. Case studies of the optical properties of bulk materials, multilayered structures, and electronic devices, mainly bolometers, are discussed and analyzed for optimization.
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U2 - 10.1007/s11837-014-0940-0
DO - 10.1007/s11837-014-0940-0
M3 - Article
AN - SCOPUS:84899055935
SN - 1047-4838
VL - 66
SP - 616
EP - 636
JO - JOM
JF - JOM
IS - 4
ER -