Endurance improvement of Ge₂Sb₂Te₅-based phase change memory

Chieh Fang Chen, A. Schrott, M. H. Lee, S. Raoux, Y. H. Shih, M. Breitwisch, F. H. Baumann, E. K. Lai, T. M. Shaw, P. Flaitz, R. Cheek, E. A. Joseph, S. H. Chen, B. Rajendran, H. L. Lung, C. Lam

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution