Epitaxial checkerboard arrangement of nanorods in ZnMnGaO4 films studied by x-ray diffraction

S. M. O'Malley, P. L. Bonanno, K. H. Ahn, A. A. Sirenko, A. Kazimirov, M. Tanimura, T. Asada, S. Park, Y. Horibe, S. W. Cheong

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

The intriguing structural properties of a ZnMnGaO4 film epitaxially grown on MgO (001) substrate have been investigated using synchrotron-radiation-based x-ray diffraction. The ZnMnGaO4 film consisted of a self-assembled checkerboard (CB) structure with highly aligned and regularly spaced vertical nanorods. The lattice parameters of the orthorhombic and rotated tetragonal phases of the CB structure were analyzed by measuring H-K, H-L, and K-L cross-sectional reciprocal space maps. We demonstrate that symmetry of lattice distortions at the phase boundaries provides means for the coherent coexistence of two domain types within the film volume.

Original languageEnglish (US)
Article number165424
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume78
Issue number16
DOIs
StatePublished - Oct 27 2008

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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