Epitaxial checkerboard arrangement of nanorods in ZnMnGaO4 films studied by x-ray diffraction

S. M. O'Malley; P. L. Bonanno; K. H. Ahn; A. A. Sirenko; A. Kazimirov; M. Tanimura; T. Asada; S. Park; Y. Horibe; S. W. Cheong

doi:10.1103/PhysRevB.78.165424

Epitaxial checkerboard arrangement of nanorods in ZnMnGaO4 films studied by x-ray diffraction

S. M. O'Malley, P. L. Bonanno, K. H. Ahn, A. A. Sirenko, A. Kazimirov, M. Tanimura, T. Asada, S. Park, Y. Horibe, S. W. Cheong

Physics

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5 Scopus citations

Abstract

The intriguing structural properties of a ZnMnGaO4 film epitaxially grown on MgO (001) substrate have been investigated using synchrotron-radiation-based x-ray diffraction. The ZnMnGaO4 film consisted of a self-assembled checkerboard (CB) structure with highly aligned and regularly spaced vertical nanorods. The lattice parameters of the orthorhombic and rotated tetragonal phases of the CB structure were analyzed by measuring H-K, H-L, and K-L cross-sectional reciprocal space maps. We demonstrate that symmetry of lattice distortions at the phase boundaries provides means for the coherent coexistence of two domain types within the film volume.

Original language	English (US)
Article number	165424
Journal	Physical Review B - Condensed Matter and Materials Physics
Volume	78
Issue number	16
DOIs	https://doi.org/10.1103/PhysRevB.78.165424
State	Published - Oct 27 2008

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

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10.1103/PhysRevB.78.165424

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abstract = "The intriguing structural properties of a ZnMnGaO4 film epitaxially grown on MgO (001) substrate have been investigated using synchrotron-radiation-based x-ray diffraction. The ZnMnGaO4 film consisted of a self-assembled checkerboard (CB) structure with highly aligned and regularly spaced vertical nanorods. The lattice parameters of the orthorhombic and rotated tetragonal phases of the CB structure were analyzed by measuring H-K, H-L, and K-L cross-sectional reciprocal space maps. We demonstrate that symmetry of lattice distortions at the phase boundaries provides means for the coherent coexistence of two domain types within the film volume.",

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T1 - Epitaxial checkerboard arrangement of nanorods in ZnMnGaO4 films studied by x-ray diffraction

AU - O'Malley, S. M.

AU - Bonanno, P. L.

AU - Ahn, K. H.

AU - Sirenko, A. A.

AU - Kazimirov, A.

AU - Tanimura, M.

AU - Asada, T.

AU - Park, S.

AU - Horibe, Y.

AU - Cheong, S. W.

PY - 2008/10/27

Y1 - 2008/10/27

N2 - The intriguing structural properties of a ZnMnGaO4 film epitaxially grown on MgO (001) substrate have been investigated using synchrotron-radiation-based x-ray diffraction. The ZnMnGaO4 film consisted of a self-assembled checkerboard (CB) structure with highly aligned and regularly spaced vertical nanorods. The lattice parameters of the orthorhombic and rotated tetragonal phases of the CB structure were analyzed by measuring H-K, H-L, and K-L cross-sectional reciprocal space maps. We demonstrate that symmetry of lattice distortions at the phase boundaries provides means for the coherent coexistence of two domain types within the film volume.

AB - The intriguing structural properties of a ZnMnGaO4 film epitaxially grown on MgO (001) substrate have been investigated using synchrotron-radiation-based x-ray diffraction. The ZnMnGaO4 film consisted of a self-assembled checkerboard (CB) structure with highly aligned and regularly spaced vertical nanorods. The lattice parameters of the orthorhombic and rotated tetragonal phases of the CB structure were analyzed by measuring H-K, H-L, and K-L cross-sectional reciprocal space maps. We demonstrate that symmetry of lattice distortions at the phase boundaries provides means for the coherent coexistence of two domain types within the film volume.

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Epitaxial checkerboard arrangement of nanorods in ZnMnGaO4 films studied by x-ray diffraction

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