Evaluation of encapsulation and passivation of InGaAs/InP DHBT devices for long-term reliability
- R. F. Kopf
- , R. A. Hamm
- , R. W. Ryan
- , J. Burm
- , A. Tate
- , Y. K. Chen
- , G. Georgiou
- , D. V. Lang
- , F. Ren
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