Abstract
Photoluminescence (PL) of nanocrystalline Si (nc-Si) assemblies formed by thermal crystallization of amorphous Si/SiO2 and SiO/SiO2 superlattices (SLs) has been investigated at different temperatures and excitation conditions. The low temperature resonant PL spectroscopy reveals phonon-assisted excitonic recombination. At room temperature the samples formed from a-SiO/SiO2 SLs possess relatively high PL quantum yield (∼ 1%). The PL transients have non-exponential decay, which indicates the exciton energy transfer in nc-Si ensembles. The excitonic energy of Er-doped nc-Si SL structures can be almost completely transferred to Er ions incorporated in SiO2 matrix that results in a strong emission line at 0.81 eV.
Original language | English (US) |
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Pages (from-to) | 227-232 |
Number of pages | 6 |
Journal | Materials Research Society Symposium - Proceedings |
Volume | 789 |
DOIs | |
State | Published - 2003 |
Event | Quantum Dots, Nanoparticles and Nanowires - Boston, MA, United States Duration: Dec 1 2003 → Dec 5 2003 |
All Science Journal Classification (ASJC) codes
- General Materials Science
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering