Experimental tests of localization in semiconductors

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Abstract

The characteristic lengths of the electron wave function in a random three-dimensional system tend to diverge at a critical point at zero temperature and a density nc. The results differ from predictions of Mott and of scaling theories of localization. The lengths associated with electron diffusion appear to be dominated by Coulomb interactions and electron-electron inelastic scattering.

Original languageEnglish (US)
Pages (from-to)81-83
Number of pages3
JournalPhysica B+C
Volume117-118
Issue numberPART 1
DOIs
StatePublished - Jan 1 1983
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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