Experimental tests of localization in semiconductors

G. A. Thomas

doi:10.1016/0378-4363(83)90447-3

Experimental tests of localization in semiconductors

G. A. Thomas

Research output: Contribution to journal › Article › peer-review

11 Scopus citations

Abstract

The characteristic lengths of the electron wave function in a random three-dimensional system tend to diverge at a critical point at zero temperature and a density n_c. The results differ from predictions of Mott and of scaling theories of localization. The lengths associated with electron diffusion appear to be dominated by Coulomb interactions and electron-electron inelastic scattering.

Original language	English (US)
Pages (from-to)	81-83
Number of pages	3
Journal	Physica B+C
Volume	117-118
Issue number	PART 1
DOIs	https://doi.org/10.1016/0378-4363(83)90447-3
State	Published - Mar 1983
Externally published	Yes

All Science Journal Classification (ASJC) codes

General Engineering

Access to Document

10.1016/0378-4363(83)90447-3

Cite this

@article{208d48e29fd64e8c9dde206e314b2e06,

title = "Experimental tests of localization in semiconductors",

abstract = "The characteristic lengths of the electron wave function in a random three-dimensional system tend to diverge at a critical point at zero temperature and a density nc. The results differ from predictions of Mott and of scaling theories of localization. The lengths associated with electron diffusion appear to be dominated by Coulomb interactions and electron-electron inelastic scattering.",

author = "Thomas, \{G. A.\}",

year = "1983",

month = mar,

doi = "10.1016/0378-4363(83)90447-3",

language = "English (US)",

volume = "117-118",

pages = "81--83",

journal = "Physica B+C",

issn = "0378-4363",

publisher = "North-Holland Publ Co",

number = "PART 1",

}

TY - JOUR

T1 - Experimental tests of localization in semiconductors

AU - Thomas, G. A.

PY - 1983/3

Y1 - 1983/3

N2 - The characteristic lengths of the electron wave function in a random three-dimensional system tend to diverge at a critical point at zero temperature and a density nc. The results differ from predictions of Mott and of scaling theories of localization. The lengths associated with electron diffusion appear to be dominated by Coulomb interactions and electron-electron inelastic scattering.

AB - The characteristic lengths of the electron wave function in a random three-dimensional system tend to diverge at a critical point at zero temperature and a density nc. The results differ from predictions of Mott and of scaling theories of localization. The lengths associated with electron diffusion appear to be dominated by Coulomb interactions and electron-electron inelastic scattering.

UR - https://www.scopus.com/pages/publications/0020098171

UR - https://www.scopus.com/pages/publications/0020098171#tab=citedBy

U2 - 10.1016/0378-4363(83)90447-3

DO - 10.1016/0378-4363(83)90447-3

M3 - Article

AN - SCOPUS:0020098171

SN - 0378-4363

VL - 117-118

SP - 81

EP - 83

JO - Physica B+C

JF - Physica B+C

IS - PART 1

ER -

Experimental tests of localization in semiconductors

Abstract

All Science Journal Classification (ASJC) codes

Access to Document

Other files and links

Fingerprint

Cite this