Abstract
An intense photoluminescence (PL) peaking near 0.9 eV is emitted by a single Si1-xGex nanometer-thick layer (NL) with x ≈ 8% incorporated into Si/Si0.6Ge0.4 cluster multilayers (CMs). The SiGe NL PL does not saturate in output intensity with up to 50 mJ/cm 2 of excitation energy density, and it has nearly a 1000 times shorter lifetime compared to CM PL, which peaks at ∼0.8 eV. These dramatic differences in observed PL properties are attributed to different compositions and structures of the Si/SiGe NL and CM hetero-interfaces.
Original language | English (US) |
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Article number | 033103 |
Journal | Applied Physics Letters |
Volume | 103 |
Issue number | 3 |
DOIs | |
State | Published - Jul 15 2013 |
All Science Journal Classification (ASJC) codes
- Physics and Astronomy (miscellaneous)