@inproceedings{c82b8de1cc7e4c9b8331e0da4d5d45a8,
title = "Fault Density, Fault Depth and Fault Multiplicity: The Reward of Discernment",
abstract = "Using a semantics-based definition of faults, we discuss three distinct but related concepts, and illustrate their differences by means of simple experiments: fault density (number of faults in a program); fault depth (the minimal number of fault removals needed to make a program correct); and fault multiplicity (the number of atomic changes needed to repair a single fault).",
keywords = "elementaary fault, fault, fault density, fault depth, fault multiplicity, fault removal",
author = "Besma Khaireddine and Aleksandr Zakharchenko and Ali Mili",
year = "2019",
month = jul,
doi = "10.1109/QRS-C.2019.00110",
language = "English (US)",
series = "Proceedings - Companion of the 19th IEEE International Conference on Software Quality, Reliability and Security, QRS-C 2019",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "532--533",
booktitle = "Proceedings - Companion of the 19th IEEE International Conference on Software Quality, Reliability and Security, QRS-C 2019",
address = "United States",
note = "19th IEEE International Conference on Software Quality, Reliability and Security Companion, QRS-C 2019 ; Conference date: 22-07-2019 Through 26-07-2019",
}