Fault Propagation Through Embedded Multiport Memories

Jacob Savir, William H. McAnney, Salvatore R. Vecchio

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

An analytical method is described for determining the random pattern testability of permanent faults in the prelogic driving the data-in and the address lines of a multiport random access memory whose outputs are directly observable. The results can be used with minimal extensions to existing detection probability tools such as the cutting algorithm.

Original languageEnglish (US)
Pages (from-to)592-602
Number of pages11
JournalIEEE Transactions on Computers
VolumeC-36
Issue number5
DOIs
StatePublished - May 1987
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Software
  • Theoretical Computer Science
  • Hardware and Architecture
  • Computational Theory and Mathematics

Fingerprint Dive into the research topics of 'Fault Propagation Through Embedded Multiport Memories'. Together they form a unique fingerprint.

Cite this