Fault Propagation Through Embedded Multiport Memories

Jacob Savir; William H. McAnney; Salvatore R. Vecchio

doi:10.1109/TC.1987.1676944

Fault Propagation Through Embedded Multiport Memories

Jacob Savir, William H. McAnney, Salvatore R. Vecchio

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

An analytical method is described for determining the random pattern testability of permanent faults in the prelogic driving the data-in and the address lines of a multiport random access memory whose outputs are directly observable. The results can be used with minimal extensions to existing detection probability tools such as the cutting algorithm.

Original language	English (US)
Pages (from-to)	592-602
Number of pages	11
Journal	IEEE Transactions on Computers
Volume	C-36
Issue number	5
DOIs	https://doi.org/10.1109/TC.1987.1676944
State	Published - May 1987
Externally published	Yes

All Science Journal Classification (ASJC) codes

Software
Theoretical Computer Science
Hardware and Architecture
Computational Theory and Mathematics

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10.1109/TC.1987.1676944

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title = "Fault Propagation Through Embedded Multiport Memories",

abstract = "An analytical method is described for determining the random pattern testability of permanent faults in the prelogic driving the data-in and the address lines of a multiport random access memory whose outputs are directly observable. The results can be used with minimal extensions to existing detection probability tools such as the cutting algorithm.",

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JO - IEEE Transactions on Computers

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Fault Propagation Through Embedded Multiport Memories

Abstract

All Science Journal Classification (ASJC) codes

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