Fault Propagation Through Embedded Multiport Memories

Jacob Savir, William H. McAnney, Salvatore R. Vecchio

Research output: Contribution to journalArticlepeer-review

3 Scopus citations


An analytical method is described for determining the random pattern testability of permanent faults in the prelogic driving the data-in and the address lines of a multiport random access memory whose outputs are directly observable. The results can be used with minimal extensions to existing detection probability tools such as the cutting algorithm.

Original languageEnglish (US)
Pages (from-to)592-602
Number of pages11
JournalIEEE Transactions on Computers
Issue number5
StatePublished - May 1987
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Software
  • Theoretical Computer Science
  • Hardware and Architecture
  • Computational Theory and Mathematics


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