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Fault Propagation Through Embedded Multiport Memories
Jacob Savir
, William H. McAnney
, Salvatore R. Vecchio
Research output
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Contribution to journal
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Article
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peer-review
3
Scopus citations
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Keyphrases
Analytical Method
100%
Random Access Memory
100%
Detection Probability
100%
Testability
100%
Cutting Algorithm
100%
Minimal Extension
100%
Fault Propagation
100%
Multiport
100%
Permanent Fault
100%
Multi-port Memory
100%
Engineering
Random Access Memory
100%
Observables
100%
Detection Probability
100%
Testability
100%
Address Line
100%
Multiport Memory
100%
Computer Science
Random Access Memory
100%
Detection Probability
100%
Random Pattern
100%
Permanent Fault
100%
Multiport Memory
100%