FedChip: Federated LLM for Artificial Intelligence Accelerator Chip Design

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

AI hardware design is advancing rapidly, driven by the promise of design automation to make chip development faster, more efficient, and more accessible to a wide range of users. Amongst automation tools, Large Language Models (LLMs) offer a promising solution by automating and streamlining parts of the design process. However, their potential is hindered by data privacy concerns and the lack of domain-specific training. To address this, we introduce FedChip, a Federated fine-tuning approach that enables multiple Chip design parties to collaboratively enhance a shared LLM dedicated for automated hardware design generation while protecting proprietary data. FedChip enables parties to train the model on proprietary local data and improve the shared LLM's performance. To exemplify FedChip's deployment, we create and release APTPU-Gen, a dataset of 30k design variations spanning various performance metric values such as power, performance, and area (PPA). To encourage the LLM to generate designs that achieve a balance across multiple quality metrics, we propose a new design evaluation metric, Chip@k, which statistically evaluates the quality of generated designs against predefined acceptance criteria. Experimental results show that FedChip improves design quality by more than 77% over high-end LLMs while maintaining data privacy.

Original languageEnglish (US)
Title of host publicationProceedings - 2025 IEEE International Conference on LLM-Aided Design, ICLAD 2025
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages93-99
Number of pages7
ISBN (Electronic)9798331525972
DOIs
StatePublished - 2025
Event1st IEEE International Conference on LLM-Aided Design, ICLAD 2025 - Stanford, United States
Duration: Jun 26 2025Jun 27 2025

Publication series

NameProceedings - 2025 IEEE International Conference on LLM-Aided Design, ICLAD 2025

Conference

Conference1st IEEE International Conference on LLM-Aided Design, ICLAD 2025
Country/TerritoryUnited States
CityStanford
Period6/26/256/27/25

All Science Journal Classification (ASJC) codes

  • Artificial Intelligence
  • Computational Mechanics
  • Computer Science Applications
  • Computer Vision and Pattern Recognition

Keywords

  • Federated learning
  • hardware design automation
  • large language models (LLMs)
  • PPA optimization

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