Generalized ellipsometry for orthorhombic, absorbing materials: Dielectric functions, phonon modes and band-to-band transitions of Sb2S 3

M. Schubert; T. Hofmann; C. M. Herzinger; W. Dollase

doi:10.1016/j.tsf.2003.11.207

Generalized ellipsometry for orthorhombic, absorbing materials: Dielectric functions, phonon modes and band-to-band transitions of Sb₂S ₃

M. Schubert
, T. Hofmann
, C. M. Herzinger
, W. Dollase

Research output: Contribution to journal › Conference article › peer-review

38 Scopus citations

Abstract

Generalized ellipsometry allows complete extraction of the dielectric function tensor, including orientation, from measurement of skew-cut single crystal orthorhombic absorbing materials. As an example, Stibnite (Sb ₂S₃) is studied to determine fundamental phonon modes and band-to-band transitions, which are here provided for polarization along axes a, b, and c from lineshape analysis of the major dielectric function spectra.

Original language	English (US)
Pages (from-to)	619-623
Number of pages	5
Journal	Thin Solid Films
Volume	455-456
DOIs	https://doi.org/10.1016/j.tsf.2003.11.207
State	Published - May 1 2004
Externally published	Yes
Event	The 3rd International Conference on Spectroscopic Ellipsometry - Vienna, Austria Duration: Jul 6 2003 → Jul 11 2003

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Surfaces and Interfaces
Surfaces, Coatings and Films
Metals and Alloys
Materials Chemistry

Keywords

Anisotropy
Band-to-band transitions
Dielectric functions
Generalized ellipsometry
Phonon modes
Stibnite

Access to Document

10.1016/j.tsf.2003.11.207

Cite this

@article{649c2d22a4f742dfaa30c063e3045d3b,

title = "Generalized ellipsometry for orthorhombic, absorbing materials: Dielectric functions, phonon modes and band-to-band transitions of Sb2S 3",

abstract = "Generalized ellipsometry allows complete extraction of the dielectric function tensor, including orientation, from measurement of skew-cut single crystal orthorhombic absorbing materials. As an example, Stibnite (Sb 2S3) is studied to determine fundamental phonon modes and band-to-band transitions, which are here provided for polarization along axes a, b, and c from lineshape analysis of the major dielectric function spectra.",

keywords = "Anisotropy, Band-to-band transitions, Dielectric functions, Generalized ellipsometry, Phonon modes, Stibnite",

author = "M. Schubert and T. Hofmann and Herzinger, \{C. M.\} and W. Dollase",

year = "2004",

month = may,

day = "1",

doi = "10.1016/j.tsf.2003.11.207",

language = "English (US)",

volume = "455-456",

pages = "619--623",

journal = "Thin Solid Films",

issn = "0040-6090",

publisher = "Elsevier B.V.",

note = "The 3rd International Conference on Spectroscopic Ellipsometry ; Conference date: 06-07-2003 Through 11-07-2003",

}

TY - JOUR

T1 - Generalized ellipsometry for orthorhombic, absorbing materials

T2 - The 3rd International Conference on Spectroscopic Ellipsometry

AU - Schubert, M.

AU - Hofmann, T.

AU - Herzinger, C. M.

AU - Dollase, W.

PY - 2004/5/1

Y1 - 2004/5/1

N2 - Generalized ellipsometry allows complete extraction of the dielectric function tensor, including orientation, from measurement of skew-cut single crystal orthorhombic absorbing materials. As an example, Stibnite (Sb 2S3) is studied to determine fundamental phonon modes and band-to-band transitions, which are here provided for polarization along axes a, b, and c from lineshape analysis of the major dielectric function spectra.

AB - Generalized ellipsometry allows complete extraction of the dielectric function tensor, including orientation, from measurement of skew-cut single crystal orthorhombic absorbing materials. As an example, Stibnite (Sb 2S3) is studied to determine fundamental phonon modes and band-to-band transitions, which are here provided for polarization along axes a, b, and c from lineshape analysis of the major dielectric function spectra.

KW - Anisotropy

KW - Band-to-band transitions

KW - Dielectric functions

KW - Generalized ellipsometry

KW - Phonon modes

KW - Stibnite

UR - https://www.scopus.com/pages/publications/17144453334

UR - https://www.scopus.com/pages/publications/17144453334#tab=citedBy

U2 - 10.1016/j.tsf.2003.11.207

DO - 10.1016/j.tsf.2003.11.207

M3 - Conference article

AN - SCOPUS:17144453334

SN - 0040-6090

VL - 455-456

SP - 619

EP - 623

JO - Thin Solid Films

JF - Thin Solid Films

Y2 - 6 July 2003 through 11 July 2003

ER -