Generator choices for delay test

Keyphrases

• Built-in-self-test (BiST) 66%
• Cost Performance 33%
• Delay Faults 33%
• Delay Test 100%
• On chip 33%
• Performance Flexibility 33%
• Scan Design 33%
• Test Vector 66%
• Time Constraints 33%
• Vector Signal Generator 33%

Engineering

• Built-in Self Test 100%
• Cost Performance 50%
• Tasks 50%