Hall Effect Characterization of the Electrical Properties of 2D and Topologically Protected Materials

Research output: Chapter in Book/Report/Conference proceedingChapter

Abstract

In this chapter we present the classical, quantum, and topological descriptions of electron transport measurements. Hall measurements are introduced using classical physics. The quantization of the electronic levels due to a magnetic field known as the Landau levels is shown. The observation of the quantization of the conductivity in a 2D electron gas at low temperature and high magnetic field due to the pioneering research of von Klitzing is presented. This leads to the introduction of the Berry phase and topological explanation of the quantized conductance. The relationship between the Kubo formula for conductance and topological quantification due to the research of Thouless, Kohmoto, Nightingale, and den Nijs is presented. The Hall characterization of single layer graphene and the observation of the Berry phase confirming the presence of Dirac carriers is used to demonstrate the topological properties of graphene. The family of Hall effects is also presented.

Original languageEnglish (US)
Title of host publicationSpringer Series in Materials Science
PublisherSpringer Science and Business Media Deutschland GmbH
Pages179-227
Number of pages49
DOIs
StatePublished - 2021
Externally publishedYes

Publication series

NameSpringer Series in Materials Science
Volume318
ISSN (Print)0933-033X
ISSN (Electronic)2196-2812

All Science Journal Classification (ASJC) codes

  • General Materials Science

Fingerprint

Dive into the research topics of 'Hall Effect Characterization of the Electrical Properties of 2D and Topologically Protected Materials'. Together they form a unique fingerprint.

Cite this