Making chip and module tests compatible simplifies the testing process and takes advantage of the test data computed at the chip level by applying them to the module level directly. To make a chip-in-place test possible, hardware can be added to each chip so that it becomes a natural testing entity by either latching all inputs or all outputs.
|Original language||English (US)|
|Number of pages||1|
|Journal||IBM technical disclosure bulletin|
|Issue number||7 A|
|State||Published - Dec 1 1984|
All Science Journal Classification (ASJC) codes