HARDWARE THAT SIMPLIFIES THE TESTING PROCESS BY MAKING CHIP AND MODULE TEST COMPATIBLE.

D. L. Ostapko, J. Savir

Research output: Contribution to journalArticlepeer-review

Abstract

Making chip and module tests compatible simplifies the testing process and takes advantage of the test data computed at the chip level by applying them to the module level directly. To make a chip-in-place test possible, hardware can be added to each chip so that it becomes a natural testing entity by either latching all inputs or all outputs.

Original languageEnglish (US)
Number of pages1
JournalIBM technical disclosure bulletin
Volume27
Issue number7 A
StatePublished - Dec 1 1984
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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