Abstract
In this paper, we propose a novel deep ultra-violet (DUV) AlGaN/GaN multi-quantum well light-emitting diode (LED) with a step-graded n-type AlInGaN electron blocking layer (EBL) instead of a conventional p-type AlGaN EBL. This is designed for a~265 nm wavelength emission without affecting the hole injection efficiency. Due to enhanced carrier transport in the step-graded n-type EBL structure, there occurs reduced electron leakage into the p-region, superior hole activation and hole injection, improved output power and internal quantum efficiency (IQE). Moreover, this specially designed EBL reduces the quantum confined stark effect in the active region, ultimately enhancing the carrier wave functions overlap. The device structure is simulated using Atlas technology computer-aided design (TCAD). The internal quantum efficiency is improved from ~36.48% to ~49.46% while switching from conventional p-type EBL to step-graded n-type EBL. Furthermore, our proposed structure exhibits 1.61% efficiency droop, which is significantly ~4.8 times lower as compared to the regular structure.
Original language | English (US) |
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Pages (from-to) | 311-320 |
Number of pages | 10 |
Journal | Journal of Optoelectronics and Advanced Materials |
Volume | 25 |
Issue number | 7-8 |
State | Published - Jul 2023 |
Externally published | Yes |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics
- Electrical and Electronic Engineering
Keywords
- Electron blocking layer (EBL)
- Internal quantum efficiency (IQE)
- Light-emitting diode (LED)
- Multi-quantum well (MQW)
- Ultra-violet (UV)