High-pressure X-ray near-edge absorption study of thallium rhenium oxide up to 10.86 GPa

J. M. Ablett, C. C. Kao, S. R. Shieh, H. K. Mao, M. Croft, T. A. Tyson

Research output: Contribution to journalArticlepeer-review

11 Scopus citations

Fingerprint

Dive into the research topics of 'High-pressure X-ray near-edge absorption study of thallium rhenium oxide up to 10.86 GPa'. Together they form a unique fingerprint.

Keyphrases

Material Science

Physics