Highly aligned epitaxial nanorods with a checkerboard pattern in oxide films

S. Park, Y. Horibe, T. Asada, L. S. Wielunski, N. Lee, P. L. Bonanno, S. M. O'Malley, A. A. Sirenko, A. Kazimirov, M. Tanimura, T. Gustafsson, S. W. Cheong

Research output: Contribution to journalArticlepeer-review

32 Scopus citations

Abstract

One of the central challenges of nanoscience is fabrication of nanoscale structures with well-controlled architectures using planar thin-film technology. Herein, we report that ordered nanocheckerboards in ZnMnGaO 4 films were grown epitaxially on single-crystal MgO substrates by utilizing a solid-state method of the phase separation-induced self-assembly. The films consist of two types of chemically distinct and regularly spaced nanorods with mutually coherent interfaces, ∼4 × 4 × 750 nm 3 in size and perfectly aligned along the film growth direction. Surprisingly, a significant in-plane strain, more than 2%, from the substrate is globally maintained over the entire film thickness of about 820 nm. The strain energy from Jahn-Teller distortions and the film-substrate lattice mismatch induce the coherent three-dimensional (3D) self-assembled nanostructure, relieving the volume strain energy while suppressing the formation of dislocations.

Original languageEnglish (US)
Pages (from-to)720-724
Number of pages5
JournalNano Letters
Volume8
Issue number2
DOIs
StatePublished - Feb 2008

All Science Journal Classification (ASJC) codes

  • Bioengineering
  • Chemistry(all)
  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanical Engineering

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