Identification of failing tests with cycling registers

J. Savir, W. H. McAnney

Research output: Chapter in Book/Report/Conference proceedingConference contribution

41 Scopus citations

Abstract

A method is presented of operating on signatures from a cycling register such that the complexity of identifying multiple failing tests is comparable to that of identifying a single failing test. The method has some interesting aliasing characteristics. The authors show the probability of aliasing and suggest how it can be kept relatively small. The efficiency of the method decreases as the number of failing tests increase. The reduction in efficiency is due to an increase in aliasing probability caused by footprints being lost in the cycling registers. The larger the number of failing tests, the greater is the chance that aliasing will occur.

Original languageEnglish (US)
Title of host publicationDigest of Papers - International Test Conference
PublisherPubl by IEEE
Pages322-328
Number of pages7
ISBN (Print)0818608706
StatePublished - Dec 1 1988
Externally publishedYes

Publication series

NameDigest of Papers - International Test Conference
ISSN (Print)0743-1686

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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