Image steganalysis based on moments of characteristic functions using wavelet decomposition, prediction-error image, and neural network

Yun-Qing Shi, Guorong Xuan, Dekun Zou, Jianjiong Gao, Chengyun Yang, Zhenping Zhang, Peiqi Chai, Wen Chen, Chunhua Chen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

127 Scopus citations

Abstract

In this paper, a general blind image steganalysis system is proposed, in which the statistical moments of characteristic functions of the prediction-error image, the test image, and their wavelet subbands are selected as features. Artificial neural network is utilized as the classifier. The performance of the proposed steganalysis system is significantly superior to the prior arts.

Original languageEnglish (US)
Title of host publicationIEEE International Conference on Multimedia and Expo, ICME 2005
Pages269-272
Number of pages4
DOIs
StatePublished - Dec 1 2005
EventIEEE International Conference on Multimedia and Expo, ICME 2005 - Amsterdam, Netherlands
Duration: Jul 6 2005Jul 8 2005

Publication series

NameIEEE International Conference on Multimedia and Expo, ICME 2005
Volume2005

Other

OtherIEEE International Conference on Multimedia and Expo, ICME 2005
CountryNetherlands
CityAmsterdam
Period7/6/057/8/05

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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