Impact of constant voltage stress on high-κ gate dielectric for RF IC performance

Keyphrases

• Gate Dielectric 100%
• Constant Voltage Stress 100%
• Radio-frequency Integrated Circuit (RF IC) 100%
• Modem 33%
• Potential Impact 33%
• High-k Dielectric 33%
• Gate Stack 33%
• Electron Traps 33%
• Metal Gate 33%
• CMOS Circuits 33%
• Analog Signal 33%
• Threshold Voltage 33%
• Parameter Degradation 33%
• RF IC Design 33%
• Mixed-signal 33%
• Device Parameters 33%
• CMOS Gate 33%
• Transconductance 33%
• Voltage Stress on Devices 33%
• Advanced CMOS 33%

Engineering

• Constant Voltage 100%
• Gate Dielectric 100%
• Dielectrics 33%
• Gate Stack 33%
• Metal Gate 33%
• Integrated Circuit Design 33%
• Noise Gain 33%