Impact of gate material on low-frequency noise of nMOSFETs with 1.5 nm SiON gate dielectric: Testing the limits of the number fluctuations theory

P. Srinivasan, E. Simoen, L. Pantisano, C. Claeys, Durgamadhab Misra

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

4 Scopus citations

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Physics & Astronomy