Impact of high-k gate stack material with metal gates on LF noise in n- and p-MOSFETs

  • P. Srinivasan
  • , E. Simoen
  • , L. Pantisano
  • , C. Claeys
  • , D. Misra

Research output: Contribution to journal › Conference article › peer-review

34 Scopus citations

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Engineering

Material Science

Physics