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Impact of the interfacial layer on the low-frequency noise (1/f) behavior of MOSFETs with advanced gate stacks
F. Crupi, P. Srinivasan, P. Magnone, E. Simoen, C. Pace, Durgamadhab Misra, C. Claeys
Research output: Contribution to journal › Article › peer-review
51
Scopus
citations