TY - GEN
T1 - Implications of modified simplified hybrid process on CIGS devices and minimodules
AU - Sahoo, Leena K.
AU - Akhtar, Masud
AU - Saramak, Renata
AU - Delahoy, Alan E.
PY - 2008
Y1 - 2008
N2 - The simplified hybrid (SH) process is the platform on which EPV Solar will develop a cost effective CIGS module manufacturing process. We have already implemented the SH process in our large area deposition system. In this report optimization of the Na access to the absorber layer was done by controlling the Cr underlayer thickness. In addition, CIGS process parameters have been modified to get a more uniform layer attaining good efficiency throughout the substrate at lower temperature. This helped us to make minimodule using our existing equipment design. Post-CIGS treatments of samples to passivate the surface before CdS chemical bath deposition have improved our earlier samples. However, this has been found to be less beneficial for newly processed samples reducing the overall processing steps. A textured ZnO window layer deposited on the buffer layer increased device Jsc by 5% by reducing reflectance of incident light.
AB - The simplified hybrid (SH) process is the platform on which EPV Solar will develop a cost effective CIGS module manufacturing process. We have already implemented the SH process in our large area deposition system. In this report optimization of the Na access to the absorber layer was done by controlling the Cr underlayer thickness. In addition, CIGS process parameters have been modified to get a more uniform layer attaining good efficiency throughout the substrate at lower temperature. This helped us to make minimodule using our existing equipment design. Post-CIGS treatments of samples to passivate the surface before CdS chemical bath deposition have improved our earlier samples. However, this has been found to be less beneficial for newly processed samples reducing the overall processing steps. A textured ZnO window layer deposited on the buffer layer increased device Jsc by 5% by reducing reflectance of incident light.
UR - http://www.scopus.com/inward/record.url?scp=84879734279&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84879734279&partnerID=8YFLogxK
U2 - 10.1109/PVSC.2008.4922542
DO - 10.1109/PVSC.2008.4922542
M3 - Conference contribution
AN - SCOPUS:84879734279
SN - 9781424416417
T3 - Conference Record of the IEEE Photovoltaic Specialists Conference
BT - 33rd IEEE Photovoltaic Specialists Conference, PVSC 2008
T2 - 33rd IEEE Photovoltaic Specialists Conference, PVSC 2008
Y2 - 11 May 2008 through 16 May 2008
ER -