In situ monitoring of a laser-induced etched grating on InP: Thin-film cell configuration

H. Grebel, B. Iskandar, P. Pien, K. Sheppard

Research output: Contribution to journalArticlepeer-review

12 Scopus citations

Abstract

On-line, first-order light diffraction from a laser-induced etched grating in a thin-film cell configuration is investigated. It is suggested that a layer of dissolved reaction products interferes with the in situ light scattering measurements.

Original languageEnglish (US)
Pages (from-to)2959-2961
Number of pages3
JournalApplied Physics Letters
Volume57
Issue number27
DOIs
StatePublished - 1990

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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