Influence of strain on the atomic and electronic structure of manganite films

Q. Qian, T. A. Tyson, M. Deleon, C. C. Kao, J. Bai, A. I. Frenkel

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Abstract

A study of the long-range, local and electronic structure of Nd0.5Sr0.5MnO3 films of varying thickness between 500 and 2000 Å has been performed. Local structure measurements at the Sr K-edge reveal a reduction of the Mn-O-Mn bond angles in films below 1000 Å. Spin-polarized measurements reveal splitting of the Mn 3d eg state in the strained region of the films and are consistent with a two-layer model for thick films with a relaxed undistorted layer on top of a strained structurally distorted layer near the substrate.

Original languageEnglish (US)
Pages (from-to)458-463
Number of pages6
JournalJournal of Physics and Chemistry of Solids
Volume68
Issue number3
DOIs
StatePublished - Mar 2007

All Science Journal Classification (ASJC) codes

  • Chemistry(all)
  • Materials Science(all)
  • Condensed Matter Physics

Keywords

  • C. XRD

Fingerprint Dive into the research topics of 'Influence of strain on the atomic and electronic structure of manganite films'. Together they form a unique fingerprint.

Cite this