Abstract
A study of the long-range, local and electronic structure of Nd0.5Sr0.5MnO3 films of varying thickness between 500 and 2000 Å has been performed. Local structure measurements at the Sr K-edge reveal a reduction of the Mn-O-Mn bond angles in films below 1000 Å. Spin-polarized measurements reveal splitting of the Mn 3d eg state in the strained region of the films and are consistent with a two-layer model for thick films with a relaxed undistorted layer on top of a strained structurally distorted layer near the substrate.
Original language | English (US) |
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Pages (from-to) | 458-463 |
Number of pages | 6 |
Journal | Journal of Physics and Chemistry of Solids |
Volume | 68 |
Issue number | 3 |
DOIs | |
State | Published - Mar 2007 |
All Science Journal Classification (ASJC) codes
- General Chemistry
- General Materials Science
- Condensed Matter Physics
Keywords
- C. XRD