Interferometric characterization of 160 fs far-infrared light pulses

B. I. Greene; J. F. Federici; D. R. Dykaar; R. R. Jones; P. H. Bucksbaum

doi:10.1063/1.105268

Interferometric characterization of 160 fs far-infrared light pulses

B. I. Greene, J. F. Federici, D. R. Dykaar, R. R. Jones, P. H. Bucksbaum

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Abstract

We report the first interferometric characterization of freely propagating, subpicosecond, far-infrared (FIR) light pulses. FIR light was generated via short pulse photoexcitation of a semi-insulating InP wafer. The half width of the intensity interferogram was 230 fs. The FIR light contained frequency components from 3 to 150 cm^-1.

Original language	English (US)
Pages (from-to)	893-895
Number of pages	3
Journal	Applied Physics Letters
Volume	59
Issue number	8
DOIs	https://doi.org/10.1063/1.105268
State	Published - 1991
Externally published	Yes

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

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10.1063/1.105268

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title = "Interferometric characterization of 160 fs far-infrared light pulses",

abstract = "We report the first interferometric characterization of freely propagating, subpicosecond, far-infrared (FIR) light pulses. FIR light was generated via short pulse photoexcitation of a semi-insulating InP wafer. The half width of the intensity interferogram was 230 fs. The FIR light contained frequency components from 3 to 150 cm-1.",

author = "Greene, {B. I.} and Federici, {J. F.} and Dykaar, {D. R.} and Jones, {R. R.} and Bucksbaum, {P. H.}",

year = "1991",

doi = "10.1063/1.105268",

language = "English (US)",

volume = "59",

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journal = "Applied Physics Letters",

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T1 - Interferometric characterization of 160 fs far-infrared light pulses

AU - Greene, B. I.

AU - Federici, J. F.

AU - Dykaar, D. R.

AU - Jones, R. R.

AU - Bucksbaum, P. H.

PY - 1991

Y1 - 1991

N2 - We report the first interferometric characterization of freely propagating, subpicosecond, far-infrared (FIR) light pulses. FIR light was generated via short pulse photoexcitation of a semi-insulating InP wafer. The half width of the intensity interferogram was 230 fs. The FIR light contained frequency components from 3 to 150 cm-1.

AB - We report the first interferometric characterization of freely propagating, subpicosecond, far-infrared (FIR) light pulses. FIR light was generated via short pulse photoexcitation of a semi-insulating InP wafer. The half width of the intensity interferogram was 230 fs. The FIR light contained frequency components from 3 to 150 cm-1.

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DO - 10.1063/1.105268

M3 - Article

AN - SCOPUS:21544460642

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SP - 893

EP - 895

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 8

ER -

Interferometric characterization of 160 fs far-infrared light pulses

Abstract

All Science Journal Classification (ASJC) codes

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