Abstract
We report the first interferometric characterization of freely propagating, subpicosecond, far-infrared (FIR) light pulses. FIR light was generated via short pulse photoexcitation of a semi-insulating InP wafer. The half width of the intensity interferogram was 230 fs. The FIR light contained frequency components from 3 to 150 cm-1.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 893-895 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 59 |
| Issue number | 8 |
| DOIs | |
| State | Published - 1991 |
| Externally published | Yes |
All Science Journal Classification (ASJC) codes
- Physics and Astronomy (miscellaneous)