TY - GEN
T1 - Interferometric terahertz imaging for detection of lethal agents using artificial neural network analyses
AU - Bandyopadhyay, Aparajita
AU - Sinyukov, Alexander M.
AU - Sengupta, Amartya
AU - Gary, Dale
AU - Federici, John
AU - Barat, Robert
AU - Michalopoulou, Zoi-Heleni
PY - 2006
Y1 - 2006
N2 - Interferometric imaging is a non-invasive, non-contact method to detect concealed lethal agents employing spectral imaging in the terahertz (THz) range. Parallel to the experimental testing over short range, extensive modeling simulates reconstructed images of lethal agents at different frequencies applying interferometric techniques. Near-field correction to such imaging has been accounted for and edge probe algorithm and consequent artificial neural network analyses identify the agents under consideration. This work addresses the issues related to THz imaging for rapid and successful recognition of lethal agents in security screening.
AB - Interferometric imaging is a non-invasive, non-contact method to detect concealed lethal agents employing spectral imaging in the terahertz (THz) range. Parallel to the experimental testing over short range, extensive modeling simulates reconstructed images of lethal agents at different frequencies applying interferometric techniques. Near-field correction to such imaging has been accounted for and edge probe algorithm and consequent artificial neural network analyses identify the agents under consideration. This work addresses the issues related to THz imaging for rapid and successful recognition of lethal agents in security screening.
KW - Artificial neural networks
KW - Detection of concealed agents
KW - Interferometric arrays
KW - Kohonen self organizing maps
KW - Terahertz imaging
UR - http://www.scopus.com/inward/record.url?scp=50649098073&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=50649098073&partnerID=8YFLogxK
U2 - 10.1109/SARNOF.2006.4534807
DO - 10.1109/SARNOF.2006.4534807
M3 - Conference contribution
AN - SCOPUS:50649098073
SN - 1424400023
SN - 9781424400027
T3 - 2006 IEEE Sarnoff Symposium
BT - 2006 IEEE Sarnoff Symposium
T2 - 2006 IEEE Sarnoff Symposium
Y2 - 27 March 2006 through 28 March 2006
ER -