Intrafacet migration effects in InGaN/GaN structures grown on triangular GaN ridges studied by submicron beam x-ray diffraction
- P. L. Bonanno
- , S. M. O'Malley
- , A. A. Sirenko
- , A. Kazimirov
- , Z. H. Cai
- , T. Wunderer
- , P. Brückner
- , F. Scholz
Research output: Contribution to journal › Article › peer-review
8
Link opens in a new tab
Scopus
citations