Intrafacet migration effects in InGaN/GaN structures grown on triangular GaN ridges studied by submicron beam x-ray diffraction

P. L. Bonanno, S. M. O'Malley, A. A. Sirenko, A. Kazimirov, Z. H. Cai, T. Wunderer, P. Brückner, F. Scholz

Research output: Contribution to journalArticlepeer-review

8 Scopus citations

Fingerprint

Dive into the research topics of 'Intrafacet migration effects in InGaN/GaN structures grown on triangular GaN ridges studied by submicron beam x-ray diffraction'. Together they form a unique fingerprint.

Physics & Astronomy