Fingerprint
Dive into the research topics of 'Intrafacet migration effects in InGaN/GaN structures grown on triangular GaN ridges studied by submicron beam x-ray diffraction'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Intrafacet migration effects in InGaN/GaN structures grown on triangular GaN ridges studied by submicron beam x-ray diffraction
P. L. Bonanno, S. M. O'Malley, A. A. Sirenko, A. Kazimirov, Z. H. Cai, T. Wunderer, P. Brückner, F. Scholz
Research output: Contribution to journal › Article › peer-review
8
Scopus
citations