Investigation of Defect States of HfO2 and SiO2 on p type Silicon using THz Spectroscopy

Amartya Sengupta, Hakan Altan, Aparajita Bandyopadhyay, John F. Federici, H. Grebel, Daniel Pham

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations


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Engineering & Materials Science

Physics & Astronomy