Is NMOSFET hot carrier lifetime degraded by charging damage?

K. P. Cheung, D. Misra, K. G. Steiner, J. I. Colonell, C. P. Chang, W. Y.C. Lai, C. T. Liu, R. Liu, C. S. Pai

Research output: Contribution to conferencePaperpeer-review

17 Scopus citations

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Engineering & Materials Science