Is NMOSFET hot carrier lifetime degraded by charging damage?
- K. P. Cheung
- , D. Misra
- , K. G. Steiner
- , J. I. Colonell
- , C. P. Chang
- , W. Y.C. Lai
- , C. T. Liu
- , R. Liu
- , C. S. Pai
Research output: Contribution to conference › Paper › peer-review
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