TY - GEN
T1 - JPEG image steganalysis utilizing both intrablock and interblock correlations
AU - Chen, Chunhua
AU - Shi, Yun Q.
N1 - Copyright:
Copyright 2008 Elsevier B.V., All rights reserved.
PY - 2008
Y1 - 2008
N2 - JPEG image steganalysis has attracted increasing attention recently. In this paper, we present an effective Markov process (MP) based JPEG steganalysis scheme, which utilizes both the intrablock and interblock correlations among JPEG coefficients. We compute transition probability matrix for each difference JPEG 2-D array to utilize the intrablock correlation, and "averaged" transition probability matrices for those difference mode 2-D arrays to utilize the interblock correlation. All the elements of these matrices are used as features for steganalysis. Experimental works over an image database of 7,560 JPEG images have demonstrated that this new approach has greatly improved JPEG steganalysis capability and outperforms the prior arts.
AB - JPEG image steganalysis has attracted increasing attention recently. In this paper, we present an effective Markov process (MP) based JPEG steganalysis scheme, which utilizes both the intrablock and interblock correlations among JPEG coefficients. We compute transition probability matrix for each difference JPEG 2-D array to utilize the intrablock correlation, and "averaged" transition probability matrices for those difference mode 2-D arrays to utilize the interblock correlation. All the elements of these matrices are used as features for steganalysis. Experimental works over an image database of 7,560 JPEG images have demonstrated that this new approach has greatly improved JPEG steganalysis capability and outperforms the prior arts.
UR - http://www.scopus.com/inward/record.url?scp=51749089283&partnerID=8YFLogxK
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U2 - 10.1109/ISCAS.2008.4542096
DO - 10.1109/ISCAS.2008.4542096
M3 - Conference contribution
AN - SCOPUS:51749089283
SN - 9781424416844
T3 - Proceedings - IEEE International Symposium on Circuits and Systems
SP - 3029
EP - 3032
BT - 2008 IEEE International Symposium on Circuits and Systems, ISCAS 2008
T2 - 2008 IEEE International Symposium on Circuits and Systems, ISCAS 2008
Y2 - 18 May 2008 through 21 May 2008
ER -