Layout Influences Testability

Thomas H. Spencer, Jacob Savir

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Abstract

This correspondence addresses actual implementation of a multiway fan-out and its effect on test generation. If a test generation ignores the fan-out implementation faults may be left undetected by the test set. Moreover, different implementations of the multiway fan-out may lead to different fault coverages. Careless implementation of the fan-out may also yield undetectable faults. Some guidelines for fan-out implementation that may enhance testability are given in this correspondence.

Original languageEnglish (US)
Pages (from-to)287-290
Number of pages4
JournalIEEE Transactions on Computers
VolumeC-34
Issue number3
DOIs
StatePublished - Jan 1 1985
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Theoretical Computer Science
  • Software
  • Hardware and Architecture
  • Computational Theory and Mathematics

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